Christine Mahoney

Christine Mahoney is an analytical chemist, polymer chemistry expert and surface analyst, who has gained notoriety in the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) to the analysis of polymers and organic materials.  She received her bachelor’s degree in chemistry in 1997 from the State University of New York at Potsdam.  After which she obtained a Ph.D. in analytical chemistry at State University of New York at Buffalo under the advisement of Joseph Gardella.  After graduate school, Christine joined the National Institute of Standards and Technology (NIST) and an NRC post-doctoral fellow in 2003, where she pioneered the field of 3-D ToF-SIMS analysis of polymeric materials.  This work was culminated in a seminal work published in Mass Spectrometry Reviews entitled “Cluster Secondary Ion Mass Spectrometry of Polymers and Related Materials”, as well as a book in the Wiley Series on Mass Spectrometry entitled “Cluster Secondary Ion Mass Spectrometry, Principles and Applications”.  After her tenure at NIST, Christine worked at the Pacific Northwest National Laboratory (PNNL) and the Naval Research Laboratory (NRL), where her focus shifted towards forensics applications of surface analytical tools.  During this time, she helped develop a statistically sound method that exploited signatures obtained from multiple analytical techniques to uniquely identify and distinguish between samples of C4 explosives.  Christine currently works as a Research Associate at Corning Incorporated, where she leads a team of scientists in developing ToF-SIMS for surface analysis of glass and their associated coatings.   She currently has over 50 publications and has given over 25 invited talks at international venues.  Christine has been active in standards organizations such as ASTM International and ISO, where she led committees and helped develop several standards related to surface analysis.  Christine has also served on several other committees, including the Applied Surface Science Division (ASSD) at AVS, and regularly serves on the scientific and program committees for the International SIMS conferences and SIMS workshops.